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74LVQ138 Low Voltage 1-of-8 Decoder/Demultiplexer
February 1992 Revised June 2001
74LVQ138 Low Voltage 1-of-8 Decoder/Demultiplexer
General Description
The LVQ138 is a high-speed 1-of-8 decoder/demultiplexer. This device is ideally suited for high-speed bipolar memory chip select address decoding. The multiple input enables allow parallel expansion to a 1-of-24 decoder using just three LVQ138 devices or a 1-of-32 decoder using four LVQ138 devices and one inverter.
Features
s Ideal for low power/low noise 3.3V applications s Guaranteed simultaneous switching noise level and dynamic threshold performance s Improved latch-up immunity s Guaranteed incident wave switching into 75 s 4kV minimum ESD immunity s Demultiplexing capability s Multiple input enable for each expansion s Active LOW mutually exclusive outputs
Ordering Code:
Order Number 74LVQ138SC 74LVQ138SJ Package Number M16A M16D Package Description 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow 16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Devices also available in Tape and Reel. Specify by appending suffix letter "X" to the ordering code.
Logic Symbols
Connection Diagram
IEEE/IEC
Pin Descriptions
Pin Names A0-A2 E1-E2 E3 O0-O7 Description Address Inputs Enable Inputs Enable Input Outputs
(c) 2001 Fairchild Semiconductor Corporation
DS011350
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74LVQ138
Functional Description
The LVQ138 high-speed 1-of-8 decoder/demultiplexer accepts three binary weighted inputs (A0, A1, A2) and, when enabled, provides eight mutually exclusive activeLOW outputs (O0-O7). The LVQ138 features three Enable inputs, two active-LOW (E1, E2) and one active-HIGH (E3). All outputs will be HIGH unless E1 and E2 are LOW and E3 is HIGH. This multiple enable function allows easy parallel expansion of the device to a 1-of-32 (5 lines to 32 lines) decoder with just four LVQ138 devices and one inverter (see Figure 1). The LVQ138 can be used as an 8-output demultiplexer by using one of the active LOW Enable inputs as the data input and the other Enable inputs as strobes. The Enable inputs which are not used must be permanently tied to their appropriate active-HIGH or activeLOW state.
Logic Diagram
Truth Table
Inputs Outputs E1 E2 E3 A0 A1 A2 O0 O1 O2 O3 O4 O5 O6 O7 H X X L L L L L L L L X H X L L L L L L L L X X L H H H H H H H H X X X L H L H L H L H X X X L L H H L L H H X X X L L L L H H H H H H H L H H H H H H H H H H H L H H H H H H H H H H H L H H H H H H H H H H H L H H H H H H H H H H H L H H H H H H H H H H H L H H H H H H H H H H H L H H H H H H H H H H H L
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial
FIGURE 1. Expansion to 1-of-32 Decoding
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74LVQ138
Absolute Maximum Ratings(Note 1)
Supply Voltage (VCC) DC Input Diode Current (IIK) VI = -0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = -0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current (ICC or IGND) Storage Temperature (TSTG) DC Latch-Up Source or Sink Current
-0.5V to +7.0V -20 mA +20 mA -0.5V to VCC + 0.5V -20 mA +20 mA -0.5V to VCC + 0.5V 50 mA 200 mA -65C to +150C 300 mA
Recommended Operating Conditions (Note 2)
Supply Voltage (VCC) Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Minimum Input Edge Rate (V/t) VIN from 0.8V to 2.0V VCC @ 3.0V 125 mV/ns 2.0V to 3.6V 0V to VCC 0V to VCC
-40C to +85C
Note 1: The "Absolute Maximum Ratings" are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the Electrical Characteristics tables are not guaranteed at the absolute maximum ratings. The "Recommended Operating Conditions" table will define the conditions for actual device operation. Note 2: Unused inputs must be held HIGH or LOW. They may not float.
DC Electrical Characteristics
Symbol VIH VIL VOH Parameter Minimum High Level Input Voltage Maximum Low Level Input Voltage Minimum High Level Output Voltage VOL Maximum Low Level Output Voltage IIN IOLD IOH ICC VOLP VOLV VIHD VILD Maximum Input Leakage Current Minimum Dynamic (Note 4) Output Current Maximum Quiescent Supply Current Quiet Output Maximum Dynamic VOL Quiet Output Minimum Dynamic VOL Maximum High Level Dynamic Input Voltage Maximum Low Level Dynamic Input Voltage VCC (V) 3.0 3.0 3.0 3.0 3.0 3.0 3.6 3.6 3.6 3.6 3.3 3.3 3.3 3.3 1.7 1.7 4.0 0.8 -0.8 2.0 0.8 0.002 TA = +25C Typ 1.5 1.5 2.99 2.0 0.8 2.9 2.58 0.1 0.36 0.1 TA = -40C to +85C Guaranteed Limits 2.0 0.8 2.9 2.48 0.1 0.44 1.0 36 -25 40.0 V V V V V V A mA mA A V V V V VOUT = 0.1V or VCC - 0.1V VOUT = 0.1V or VCC - 0.1V IOUT = -50 A VIN = VIL or VIH (Note 3) IOH = -12 mA IOUT = 50 A VIN = VIL or VIH (Note 3) IOL = 12 mA VI = VCC, GND VOLD = 0.8V Max (Note 5) VOHD = 2.0V Min (Note 5) VIN = VCC or GND (Note 6)(Note 7) (Note 6)(Note 7) (Note 6)(Note 8) (Note 6)(Note 8) Units Conditions
Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: Incident wave switching on transmission lines with impedances as low as 75 for commercial temperature range is guaranteed. Note 6: Worst case package. Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND. Note 8: Max number of Data Inputs (n) switching. (n - 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz.
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74LVQ138
AC Electrical Characteristics
TA = +25C Symbol Parameter VCC (V) tPLH tPHL tPLH tPHL tPLH tPHL tOSHL, tOSLH Propagation Delay An to On Propagation Delay An to On Propagation Delay E1 or E2 to On Propagation Delay E1 or E2 to On Propagation Delay E3 to On Propagation Delay E3 to On Output to Output Skew (Note 9) Data to Output 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 2.7 3.3 0.3 Min 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 CL = 50 pF Typ 10.2 8.5 9.6 8.0 13.2 11.0 11.4 9.5 13.2 11.0 10.2 8.5 1.0 1.0 Max 18.3 13.0 17.6 12.5 21.0 15.0 19.0 13.5 21.8 15.5 18.3 13.0 1.5 1.5 TA = -40C to +85C CL = 50 pF Min 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 1.5 Max 21.0 15.0 20.0 14.0 23.0 16.0 21.0 15.0 23.5 16.5 20.0 14.0 1.5 1.5 ns ns ns ns ns ns ns Units
Note 9: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design.
Capacitance
Symbol CIN CPD (Note 10) Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 45 Units pF pF VCC = Open VCC = 3.3V Conditions
Note 10: CPD is measured at 10 MHz.
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74LVQ138
Physical Dimensions inches (millimeters) unless otherwise noted
16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow Package Number M16A
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74LVQ138 Low Voltage 1-of-8 Decoder/Demultiplexer
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
16-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M16D Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 6 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com

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